Extreme metrology for ultrafast electron dynamics in atomic scales
发布时间: 2019-10-29     文章作者:     访问次数: 50

Extreme metrology for ultrafast electron dynamicsin atomic scales

Dong Eon Kim

Physics Department, POSTECH; Center for Attosecond Science and Technology(CASTECH),

 Max Planck POSTECH/KOREA Research Initiative


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